CVE-2002-0695

UnknownEPSS 16.95%

Last modified

CVE-2002-0695 is a vulnerability of currently unknown severity. Buffer overflow in the Transact-SQL (T-SQL) OpenRowSet component of Microsoft Data Access Components (MDAC) 2.5 through 2.7 for SQL Server 7.0 or 2000 allows remote attackers to execute arbitrary code via a query that calls the OpenRowSet command.. EPSS estimates a 16.95% chance of exploitation in the next 30 days.

Description

Buffer overflow in the Transact-SQL (T-SQL) OpenRowSet component of Microsoft Data Access Components (MDAC) 2.5 through 2.7 for SQL Server 7.0 or 2000 allows remote attackers to execute arbitrary code via a query that calls the OpenRowSet command.

Metrics

EPSS Probability
16.95%

96.7th percentile

Probability of exploitation in the next 30 days. Learn more

Affected Software

VendorProductVersionsUpdate
MicrosoftData Access Components1.5
MicrosoftData Access Components2.0
MicrosoftData Access Components2.1
MicrosoftData Access Components2.1.1.3711.11Ga
MicrosoftData Access Components2.5
MicrosoftData Access Components2.6
MicrosoftData Access Components2.7
MicrosoftData Access Components2.12.4202.3
MicrosoftMicrosoft Data Access Components2.12.4292.3_ga_clean

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2002-0695?
Buffer overflow in the Transact-SQL (T-SQL) OpenRowSet component of Microsoft Data Access Components (MDAC) 2.5 through 2.7 for SQL Server 7.0 or 2000 allows remote attackers to execute arbitrary code via a query that calls the OpenRowSet command.
How severe is CVE-2002-0695?
Severity scoring for CVE-2002-0695 is pending analysis. The EPSS model estimates a 16.95% probability of exploitation in the next 30 days.
How do I fix CVE-2002-0695?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2002-0695?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST