CVE-2002-0759

UnknownEPSS 1.35%

Last modified

CVE-2002-0759 is a vulnerability of currently unknown severity. bzip2 before 1.0.2 in FreeBSD 4.5 and earlier, OpenLinux 3.1 and 3.1.1, and possibly other operating systems, does not use the O_EXCL flag to create files during decompression and does not warn the user if an existing file would be overwritten, which could allow attackers to overwrite files via a bzip2 archive.. EPSS estimates a 1.35% chance of exploitation in the next 30 days.

Description

bzip2 before 1.0.2 in FreeBSD 4.5 and earlier, OpenLinux 3.1 and 3.1.1, and possibly other operating systems, does not use the O_EXCL flag to create files during decompression and does not warn the user if an existing file would be overwritten, which could allow attackers to overwrite files via a bzip2 archive.

Metrics

EPSS Probability
1.35%

67.9th percentile

Probability of exploitation in the next 30 days. Learn more

Affected Software

VendorProductVersions
BzipBzip20.9.0
BzipBzip20.9.0a
BzipBzip20.9.0b
BzipBzip20.9.0c
BzipBzip20.9.5a
BzipBzip20.9.5b
BzipBzip20.9.5c
BzipBzip20.9.5d
BzipBzip21.0
BzipBzip21.0.1

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2002-0759?
bzip2 before 1.0.2 in FreeBSD 4.5 and earlier, OpenLinux 3.1 and 3.1.1, and possibly other operating systems, does not use the O_EXCL flag to create files during decompression and does not warn the user if an existing file would be overwritten, which could allow attackers to overwrite files via a bzip2 archive.
How severe is CVE-2002-0759?
Severity scoring for CVE-2002-0759 is pending analysis. The EPSS model estimates a 1.35% probability of exploitation in the next 30 days.
How do I fix CVE-2002-0759?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2002-0759?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST