CVE-2003-0072

UnknownEPSS 1.95%

Last modified

CVE-2003-0072 is a vulnerability of currently unknown severity. The Key Distribution Center (KDC) in Kerberos 5 (krb5) 1.2.7 and earlier allows remote, authenticated attackers to cause a denial of service (crash) on KDCs within the same realm using a certain protocol request that causes an out-of-bounds read of an array (aka "array overrun").. EPSS estimates a 1.95% chance of exploitation in the next 30 days.

Description

The Key Distribution Center (KDC) in Kerberos 5 (krb5) 1.2.7 and earlier allows remote, authenticated attackers to cause a denial of service (crash) on KDCs within the same realm using a certain protocol request that causes an out-of-bounds read of an array (aka "array overrun").

Metrics

EPSS Probability
1.95%

77.6th percentile

Probability of exploitation in the next 30 days. Learn more

Affected Software

VendorProductVersionsUpdate
MitKerberos1.0
MitKerberos1.2.2.beta1
MitKerberos 51.0.6
MitKerberos 51.1
MitKerberos 51.1.1
MitKerberos 51.2
MitKerberos 51.2.1
MitKerberos 51.2.2
MitKerberos 51.2.3
MitKerberos 51.2.4
MitKerberos 51.2.5
MitKerberos 51.2.6
MitKerberos 51.2.7
MitKerberos 51.3Alpha1

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2003-0072?
The Key Distribution Center (KDC) in Kerberos 5 (krb5) 1.2.7 and earlier allows remote, authenticated attackers to cause a denial of service (crash) on KDCs within the same realm using a certain protocol request that causes an out-of-bounds read of an array (aka "array overrun").
How severe is CVE-2003-0072?
Severity scoring for CVE-2003-0072 is pending analysis. The EPSS model estimates a 1.95% probability of exploitation in the next 30 days.
How do I fix CVE-2003-0072?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2003-0072?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST