CVE-2003-0165
UnknownEPSS 1.68%
Last modified
CVE-2003-0165 is a vulnerability of currently unknown severity. Format string vulnerability in Eye Of Gnome (EOG) allows attackers to execute arbitrary code via format string specifiers in a command line argument for the file to display.. EPSS estimates a 1.68% chance of exploitation in the next 30 days.
Description
Format string vulnerability in Eye Of Gnome (EOG) allows attackers to execute arbitrary code via format string specifiers in a command line argument for the file to display.
Metrics
Affected Software
| Vendor | Product | Versions |
|---|---|---|
| Gnome | Eog | 1.0.0 |
| Gnome | Eog | 1.0.1 |
| Gnome | Eog | 1.0.2 |
| Gnome | Eog | 1.0.3 |
| Gnome | Eog | 1.0.4 |
| Gnome | Eog | 1.1.1 |
| Gnome | Eog | 1.1.2 |
| Gnome | Eog | 1.1.3 |
| Gnome | Eog | 1.1.4 |
| Gnome | Eog | 2.2.0 |
References
- http://www.kb.cert.org/vuls/id/363001US Government Resource
- http://www.redhat.com/support/errata/RHSA-2003-128.htmlPatch, Vendor Advisory
- http://www.securityfocus.com/bid/7121Exploit, Patch, Vendor Advisory
- http://www.kb.cert.org/vuls/id/363001US Government Resource
- http://www.redhat.com/support/errata/RHSA-2003-128.htmlPatch, Vendor Advisory
- http://www.securityfocus.com/bid/7121Exploit, Patch, Vendor Advisory
Timeline
- Published
- Last Modified
- Status
- Modified
Frequently Asked Questions
What is CVE-2003-0165?
Format string vulnerability in Eye Of Gnome (EOG) allows attackers to execute arbitrary code via format string specifiers in a command line argument for the file to display.
How severe is CVE-2003-0165?
Severity scoring for CVE-2003-0165 is pending analysis. The EPSS model estimates a 1.68% probability of exploitation in the next 30 days.
How do I fix CVE-2003-0165?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.
Are you affected by CVE-2003-0165?
Run a free Strix scan to check your systems for this vulnerability.
Scan your code nowSource: NVD / NIST
