CVE-2003-1097
UnknownEPSS 4.04%
Last modified
CVE-2003-1097 is a vulnerability of currently unknown severity. Buffer overflow in rexec on HP-UX B.10.20, B.11.00, and B.11.04, when setuid root, may allow local users to gain privileges via a long -l option.. EPSS estimates a 4.04% chance of exploitation in the next 30 days.
Description
Buffer overflow in rexec on HP-UX B.10.20, B.11.00, and B.11.04, when setuid root, may allow local users to gain privileges via a long -l option.
Metrics
Affected Software
| Vendor | Product | Versions |
|---|---|---|
| Hp | Hp-Ux | 10.10 |
| Hp | Hp-Ux | 10.16 |
| Hp | Hp-Ux | 10.20 |
| Hp | Hp-Ux | 10.24 |
| Hp | Hp-Ux | 10.26 |
| Hp | Hp-Ux | 10.30 |
| Hp | Hp-Ux | 10.34 |
| Hp | Hp-Ux | 11.00 |
| Hp | Hp-Ux | 11.04 |
| Hp | Hp-Ux | 11.11 |
| Hp | Hp-Ux | 11.20 |
| Hp | Hp-Ux | 11.22 |
References
- http://www.kb.cert.org/vuls/id/322540Third Party Advisory, US Government Resource
- http://www.kb.cert.org/vuls/id/CRDY-5MJKM4Patch, Third Party Advisory, US Government Resource
- http://www.securityfocus.com/bid/7459Exploit, Patch
- http://www.kb.cert.org/vuls/id/322540Third Party Advisory, US Government Resource
- http://www.kb.cert.org/vuls/id/CRDY-5MJKM4Patch, Third Party Advisory, US Government Resource
- http://www.securityfocus.com/bid/7459Exploit, Patch
Timeline
- Published
- Last Modified
- Status
- Modified
Frequently Asked Questions
What is CVE-2003-1097?
Buffer overflow in rexec on HP-UX B.10.20, B.11.00, and B.11.04, when setuid root, may allow local users to gain privileges via a long -l option.
How severe is CVE-2003-1097?
Severity scoring for CVE-2003-1097 is pending analysis. The EPSS model estimates a 4.04% probability of exploitation in the next 30 days.
How do I fix CVE-2003-1097?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.
Are you affected by CVE-2003-1097?
Run a free Strix scan to check your systems for this vulnerability.
Scan your code nowSource: NVD / NIST
