CVE-2004-0413

UnknownEPSS 5.88%

Last modified

CVE-2004-0413 is a vulnerability of currently unknown severity. libsvn_ra_svn in Subversion 1.0.4 trusts the length field of (1) svn://, (2) svn+ssh://, and (3) other svn protocol URL strings, which allows remote attackers to cause a denial of service (memory consumption) and possibly execute arbitrary code via an integer overflow that leads to a heap-based buffer overflow.. EPSS estimates a 5.88% chance of exploitation in the next 30 days.

Description

libsvn_ra_svn in Subversion 1.0.4 trusts the length field of (1) svn://, (2) svn+ssh://, and (3) other svn protocol URL strings, which allows remote attackers to cause a denial of service (memory consumption) and possibly execute arbitrary code via an integer overflow that leads to a heap-based buffer overflow.

Metrics

EPSS Probability
5.88%

92.3th percentile

Probability of exploitation in the next 30 days. Learn more

Affected Software

VendorProductVersions
OpenpkgOpenpkgAll versions
OpenpkgOpenpkg2.0
SubversionSubversion1.0
SubversionSubversion1.0.1
SubversionSubversion1.0.2
SubversionSubversion1.0.3
SubversionSubversion1.0.4

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2004-0413?
libsvn_ra_svn in Subversion 1.0.4 trusts the length field of (1) svn://, (2) svn+ssh://, and (3) other svn protocol URL strings, which allows remote attackers to cause a denial of service (memory consumption) and possibly execute arbitrary code via an integer overflow that leads to a heap-based buffer overflow.
How severe is CVE-2004-0413?
Severity scoring for CVE-2004-0413 is pending analysis. The EPSS model estimates a 5.88% probability of exploitation in the next 30 days.
How do I fix CVE-2004-0413?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2004-0413?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST