CVE-2005-0973

UnknownEPSS 0.29%

Last modified

CVE-2005-0973 is a vulnerability of currently unknown severity. Unknown vulnerability in the setsockopt system call in Mac OS X 10.3.9 and earlier allows local users to cause a denial of service (memory exhaustion) via crafted arguments.. EPSS estimates a 0.29% chance of exploitation in the next 30 days.

Description

Unknown vulnerability in the setsockopt system call in Mac OS X 10.3.9 and earlier allows local users to cause a denial of service (memory exhaustion) via crafted arguments.

Metrics

EPSS Probability
0.29%

20.4th percentile

Probability of exploitation in the next 30 days. Learn more

Affected Software

VendorProductVersions
AppleMac Os X10.0
AppleMac Os X10.0.1
AppleMac Os X10.0.2
AppleMac Os X10.0.3
AppleMac Os X10.0.4
AppleMac Os X10.1
AppleMac Os X10.1.1
AppleMac Os X10.1.2
AppleMac Os X10.1.3
AppleMac Os X10.1.4
AppleMac Os X10.1.5
AppleMac Os X10.2
AppleMac Os X10.2.1
AppleMac Os X10.2.2
AppleMac Os X10.2.3
AppleMac Os X10.2.4
AppleMac Os X10.2.5
AppleMac Os X10.2.6
AppleMac Os X10.2.7
AppleMac Os X10.2.8
AppleMac Os X10.3
AppleMac Os X10.3.1
AppleMac Os X10.3.2
AppleMac Os X10.3.3
AppleMac Os X10.3.4
AppleMac Os X10.3.5
AppleMac Os X10.3.6
AppleMac Os X10.3.7
AppleMac Os X10.3.8
AppleMac Os X10.3.9

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2005-0973?
Unknown vulnerability in the setsockopt system call in Mac OS X 10.3.9 and earlier allows local users to cause a denial of service (memory exhaustion) via crafted arguments.
How severe is CVE-2005-0973?
Severity scoring for CVE-2005-0973 is pending analysis. The EPSS model estimates a 0.29% probability of exploitation in the next 30 days.
How do I fix CVE-2005-0973?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2005-0973?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST