CVE-2005-1852

UnknownEPSS 4.70%

Last modified

CVE-2005-1852 is a vulnerability of currently unknown severity. Multiple integer overflows in libgadu, as used in Kopete in KDE 3.2.3 to 3.4.1, ekg before 1.6rc3, GNU Gadu, CenterICQ, Kadu, and other packages, allows remote attackers to cause a denial of service (crash) and possibly execute arbitrary code via an incoming message.. EPSS estimates a 4.70% chance of exploitation in the next 30 days.

Description

Multiple integer overflows in libgadu, as used in Kopete in KDE 3.2.3 to 3.4.1, ekg before 1.6rc3, GNU Gadu, CenterICQ, Kadu, and other packages, allows remote attackers to cause a denial of service (crash) and possibly execute arbitrary code via an incoming message.

Metrics

EPSS Probability
4.70%

90.7th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
EkgEkg1.0
EkgEkg1.0_rc2
EkgEkg1.0_rc3
EkgEkg1.1
EkgEkg1.1_rc1
EkgEkg1.1_rc2
EkgEkg1.3
EkgEkg1.4
EkgEkg1.5
EkgEkg1.5_rc1
EkgEkg1.5_rc2
KdeKde3.2.3
KdeKde3.3
KdeKde3.3.1
KdeKde3.3.2
KdeKde3.4
KdeKde3.4.0
KdeKde3.4.1
CentericqCentericqAll versions
KaduKaduAll versions

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2005-1852?
Multiple integer overflows in libgadu, as used in Kopete in KDE 3.2.3 to 3.4.1, ekg before 1.6rc3, GNU Gadu, CenterICQ, Kadu, and other packages, allows remote attackers to cause a denial of service (crash) and possibly execute arbitrary code via an incoming message.
How severe is CVE-2005-1852?
Severity scoring for CVE-2005-1852 is pending analysis. The EPSS model estimates a 4.70% probability of exploitation in the next 30 days.
How do I fix CVE-2005-1852?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2005-1852?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST