CVE-2005-4172
UnknownEPSS 1.76%
Last modified
CVE-2005-4172 is a vulnerability of currently unknown severity. eFiction 1.0, 1.1, and 2.0 allows remote attackers to obtain sensitive information via a direct request to storyblock.php without arguments, which leaks the full pathname in the resulting PHP error message.. EPSS estimates a 1.76% chance of exploitation in the next 30 days.
Description
eFiction 1.0, 1.1, and 2.0 allows remote attackers to obtain sensitive information via a direct request to storyblock.php without arguments, which leaks the full pathname in the resulting PHP error message.
Metrics
Affected Software
| Vendor | Product | Versions |
|---|---|---|
| Efiction Project | Efiction | 1.0 |
| Efiction Project | Efiction | 1.1 |
| Efiction Project | Efiction | 2.0 |
References
- http://archives.neohapsis.com/archives/bugtraq/2005-11/0301.htmlExploit, Vendor Advisory
- http://rgod.altervista.org/efiction2_xpl.htmlExploit, Vendor Advisory
- http://secunia.com/advisories/17777Exploit, Vendor Advisory
- http://archives.neohapsis.com/archives/bugtraq/2005-11/0301.htmlExploit, Vendor Advisory
- http://rgod.altervista.org/efiction2_xpl.htmlExploit, Vendor Advisory
- http://secunia.com/advisories/17777Exploit, Vendor Advisory
Timeline
- Published
- Last Modified
- Status
- Modified
Frequently Asked Questions
What is CVE-2005-4172?
eFiction 1.0, 1.1, and 2.0 allows remote attackers to obtain sensitive information via a direct request to storyblock.php without arguments, which leaks the full pathname in the resulting PHP error message.
How severe is CVE-2005-4172?
Severity scoring for CVE-2005-4172 is pending analysis. The EPSS model estimates a 1.76% probability of exploitation in the next 30 days.
How do I fix CVE-2005-4172?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.
Are you affected by CVE-2005-4172?
Run a free Strix scan to check your systems for this vulnerability.
Scan your code nowSource: NVD / NIST
