CVE-2006-2026

UnknownEPSS 9.74%

Last modified

CVE-2006-2026 is a vulnerability of currently unknown severity. Double free vulnerability in tif_jpeg.c in libtiff before 3.8.1 allows context-dependent attackers to cause a denial of service (crash) and possibly execute arbitrary code via a crafted TIFF image that triggers errors related to "setfield/getfield methods in cleanup functions.". EPSS estimates a 9.74% chance of exploitation in the next 30 days.

Description

Double free vulnerability in tif_jpeg.c in libtiff before 3.8.1 allows context-dependent attackers to cause a denial of service (crash) and possibly execute arbitrary code via a crafted TIFF image that triggers errors related to "setfield/getfield methods in cleanup functions."

Metrics

EPSS Probability
9.74%

94.9th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
LibtiffLibtiff<= 3.8.0
LibtiffLibtiff3.4
LibtiffLibtiff3.5.1
LibtiffLibtiff3.5.2
LibtiffLibtiff3.5.3
LibtiffLibtiff3.5.4
LibtiffLibtiff3.5.5
LibtiffLibtiff3.5.6
LibtiffLibtiff3.5.7
LibtiffLibtiff3.6.0
LibtiffLibtiff3.6.1
LibtiffLibtiff3.7.0
LibtiffLibtiff3.7.1

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2006-2026?
Double free vulnerability in tif_jpeg.c in libtiff before 3.8.1 allows context-dependent attackers to cause a denial of service (crash) and possibly execute arbitrary code via a crafted TIFF image that triggers errors related to "setfield/getfield methods in cleanup functions."
How severe is CVE-2006-2026?
Severity scoring for CVE-2006-2026 is pending analysis. The EPSS model estimates a 9.74% probability of exploitation in the next 30 days.
How do I fix CVE-2006-2026?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2006-2026?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST