CVE-2006-6664

UnknownEPSS 2.63%

Last modified

CVE-2006-6664 is a vulnerability of currently unknown severity. Format string vulnerability in Marathon Aleph One before 0.17.1 and 2006-12-17 might allow remote attackers to cause a denial of service (application crash) or execute arbitrary code via format string specifiers in the TopLevelLogger::logMessageV function in Misc/Logging.cpp. NOTE: some details were obtained from third party information.. EPSS estimates a 2.63% chance of exploitation in the next 30 days.

Description

Format string vulnerability in Marathon Aleph One before 0.17.1 and 2006-12-17 might allow remote attackers to cause a denial of service (application crash) or execute arbitrary code via format string specifiers in the TopLevelLogger::logMessageV function in Misc/Logging.cpp. NOTE: some details were obtained from third party information.

Metrics

EPSS Probability
2.63%

83.6th percentile

Probability of exploitation in the next 30 days. Learn more

Affected Software

VendorProductVersions
Marathon Aleph OneMarathon Aleph One<= 0.17
Marathon Aleph OneMarathon Aleph One<= 2006-12-02

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2006-6664?
Format string vulnerability in Marathon Aleph One before 0.17.1 and 2006-12-17 might allow remote attackers to cause a denial of service (application crash) or execute arbitrary code via format string specifiers in the TopLevelLogger::logMessageV function in Misc/Logging.cpp. NOTE: some details were obtained from third party information.
How severe is CVE-2006-6664?
Severity scoring for CVE-2006-6664 is pending analysis. The EPSS model estimates a 2.63% probability of exploitation in the next 30 days.
How do I fix CVE-2006-6664?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2006-6664?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST