CVE-2007-0816

UnknownEPSS 11.01%

Last modified

CVE-2007-0816 is a vulnerability of currently unknown severity. The RPC Server service (catirpc.exe) in CA (formerly Computer Associates) BrightStor ARCserve Backup 11.5 SP2 and earlier allows remote attackers to cause a denial of service (service crash) via a crafted TADDR2UADDR that triggers a null pointer dereference in catirpc.dll, possibly related to null credentials or verifier fields.. EPSS estimates a 11.01% chance of exploitation in the next 30 days.

Description

The RPC Server service (catirpc.exe) in CA (formerly Computer Associates) BrightStor ARCserve Backup 11.5 SP2 and earlier allows remote attackers to cause a denial of service (service crash) via a crafted TADDR2UADDR that triggers a null pointer dereference in catirpc.dll, possibly related to null credentials or verifier fields.

Metrics

EPSS Probability
11.01%

95.3th percentile

Probability of exploitation in the next 30 days. Learn more

Affected Software

VendorProductVersions
BroadcomBrightstor Arcserve Backup11
BroadcomBrightstor Arcserve Backup11.1
BroadcomBrightstor Arcserve Backup11.5

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2007-0816?
The RPC Server service (catirpc.exe) in CA (formerly Computer Associates) BrightStor ARCserve Backup 11.5 SP2 and earlier allows remote attackers to cause a denial of service (service crash) via a crafted TADDR2UADDR that triggers a null pointer dereference in catirpc.dll, possibly related to null credentials or verifier fields.
How severe is CVE-2007-0816?
Severity scoring for CVE-2007-0816 is pending analysis. The EPSS model estimates a 11.01% probability of exploitation in the next 30 days.
How do I fix CVE-2007-0816?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2007-0816?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST