CVE-2007-4199

UnknownEPSS 1.43%

Last modified

CVE-2007-4199 is a vulnerability of currently unknown severity. Brian Carrier The Sleuth Kit (TSK) before 2.09 allows user-assisted remote attackers to cause a denial of service (application crash) and prevent examination of certain NTFS files via a malformed NTFS image that triggers (1) dereference of a certain integer value by ntfs_dent.c in fls, or (2) dereference of a certain other integer value by ntfs.c in fsstat.. EPSS estimates a 1.43% chance of exploitation in the next 30 days.

Description

Brian Carrier The Sleuth Kit (TSK) before 2.09 allows user-assisted remote attackers to cause a denial of service (application crash) and prevent examination of certain NTFS files via a malformed NTFS image that triggers (1) dereference of a certain integer value by ntfs_dent.c in fls, or (2) dereference of a certain other integer value by ntfs.c in fsstat.

Metrics

EPSS Probability
1.43%

69.7th percentile

Probability of exploitation in the next 30 days. Learn more

Affected Software

VendorProductVersions
Brian CarrierThe Slueth Kit<= 2.08

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2007-4199?
Brian Carrier The Sleuth Kit (TSK) before 2.09 allows user-assisted remote attackers to cause a denial of service (application crash) and prevent examination of certain NTFS files via a malformed NTFS image that triggers (1) dereference of a certain integer value by ntfs_dent.c in fls, or (2) dereference of a certain other integer value by ntfs.c in fsstat.
How severe is CVE-2007-4199?
Severity scoring for CVE-2007-4199 is pending analysis. The EPSS model estimates a 1.43% probability of exploitation in the next 30 days.
How do I fix CVE-2007-4199?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2007-4199?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST