CVE-2007-6009

UnknownEPSS 3.93%

Last modified

CVE-2007-6009 is a vulnerability of currently unknown severity. Multiple buffer overflows in ACD products allow user-assisted remote attackers to execute arbitrary code via a long section string in a (1) XBM or (2) XPM file to (a) ID_X.apl or (b) IDE_ACDStd.apl. NOTE: the PSP and LHA vectors are already covered by CVE-2007-4344 and CVE-2007-6007. EPSS estimates a 3.93% chance of exploitation in the next 30 days.

Description

Multiple buffer overflows in ACD products allow user-assisted remote attackers to execute arbitrary code via a long section string in a (1) XBM or (2) XPM file to (a) ID_X.apl or (b) IDE_ACDStd.apl. NOTE: the PSP and LHA vectors are already covered by CVE-2007-4344 and CVE-2007-6007. NOTE: these might be integer overflows rather than buffer overflows.

Metrics

EPSS Probability
3.93%

89.0th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersionsUpdate
AcdseePhoto Editor4.0Build 195
AcdseePhoto Manager9.0Build 108
AcdseePro Photo Manager8.1Build 99

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2007-6009?
Multiple buffer overflows in ACD products allow user-assisted remote attackers to execute arbitrary code via a long section string in a (1) XBM or (2) XPM file to (a) ID_X.apl or (b) IDE_ACDStd.apl. NOTE: the PSP and LHA vectors are already covered by CVE-2007-4344 and CVE-2007-6007. NOTE: these might be integer overflows rather than buffer overflows.
How severe is CVE-2007-6009?
Severity scoring for CVE-2007-6009 is pending analysis. The EPSS model estimates a 3.93% probability of exploitation in the next 30 days.
How do I fix CVE-2007-6009?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2007-6009?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST