CVE-2008-3817

UnknownEPSS 1.98%

Last modified

CVE-2008-3817 is a vulnerability of currently unknown severity. Memory leak in Cisco Adaptive Security Appliances (ASA) 5500 Series and PIX Security Appliances 8.0 before 8.0(4) and 8.1 before 8.1(2) allows remote attackers to cause a denial of service (memory consumption) via an unspecified sequence of packets, related to the "initialization code for the hardware crypto accelerator.". EPSS estimates a 1.98% chance of exploitation in the next 30 days.

Description

Memory leak in Cisco Adaptive Security Appliances (ASA) 5500 Series and PIX Security Appliances 8.0 before 8.0(4) and 8.1 before 8.1(2) allows remote attackers to cause a denial of service (memory consumption) via an unspecified sequence of packets, related to the "initialization code for the hardware crypto accelerator."

Metrics

EPSS Probability
1.98%

78.0th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
CiscoAdaptive Security Appliance 5500 SeriesAll versions
CiscoPix Security Appliance8.0
CiscoPix Security Appliance8.1

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2008-3817?
Memory leak in Cisco Adaptive Security Appliances (ASA) 5500 Series and PIX Security Appliances 8.0 before 8.0(4) and 8.1 before 8.1(2) allows remote attackers to cause a denial of service (memory consumption) via an unspecified sequence of packets, related to the "initialization code for the hardware crypto accelerator."
How severe is CVE-2008-3817?
Severity scoring for CVE-2008-3817 is pending analysis. The EPSS model estimates a 1.98% probability of exploitation in the next 30 days.
How do I fix CVE-2008-3817?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2008-3817?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST