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CVE-2009-1099

UnknownEPSS 6.13%

Last modified

CVE-2009-1099 is a vulnerability of currently unknown severity. Integer signedness error in Java SE Development Kit (JDK) and Java Runtime Environment (JRE) 5.0 Update 17 and earlier, and 6 Update 12 and earlier, allows remote attackers to access files or execute arbitrary code via crafted glyph descriptions in a Type1 font, which bypasses a signed comparison and triggers a buffer overflow.. EPSS estimates a 6.13% chance of exploitation in the next 30 days.

Description

Integer signedness error in Java SE Development Kit (JDK) and Java Runtime Environment (JRE) 5.0 Update 17 and earlier, and 6 Update 12 and earlier, allows remote attackers to access files or execute arbitrary code via crafted glyph descriptions in a Type1 font, which bypasses a signed comparison and triggers a buffer overflow.

Metrics

EPSS Probability
6.13%

92.5th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
SunJava Runtime Environment5.0
SunJava Runtime Environment6.0
SunJava Se Development KitAll versions

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2009-1099?
Integer signedness error in Java SE Development Kit (JDK) and Java Runtime Environment (JRE) 5.0 Update 17 and earlier, and 6 Update 12 and earlier, allows remote attackers to access files or execute arbitrary code via crafted glyph descriptions in a Type1 font, which bypasses a signed comparison and triggers a buffer overflow.
How severe is CVE-2009-1099?
Severity scoring for CVE-2009-1099 is pending analysis. The EPSS model estimates a 6.13% probability of exploitation in the next 30 days.
How do I fix CVE-2009-1099?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2009-1099?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST