CVE-2009-1885

UnknownEPSS 5.32%

Last modified

CVE-2009-1885 is a vulnerability of currently unknown severity. Stack consumption vulnerability in validators/DTD/DTDScanner.cpp in Apache Xerces C++ 2.7.0 and 2.8.0 allows context-dependent attackers to cause a denial of service (application crash) via vectors involving nested parentheses and invalid byte values in "simply nested DTD structures," as demonstrated by the Codenomicon XML fuzzing framework.. EPSS estimates a 5.32% chance of exploitation in the next 30 days.

Description

Stack consumption vulnerability in validators/DTD/DTDScanner.cpp in Apache Xerces C++ 2.7.0 and 2.8.0 allows context-dependent attackers to cause a denial of service (application crash) via vectors involving nested parentheses and invalid byte values in "simply nested DTD structures," as demonstrated by the Codenomicon XML fuzzing framework.

Metrics

EPSS Probability
5.32%

91.6th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
ApacheXerces-C\+\+2.7.0
ApacheXerces-C\+\+2.8.0

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2009-1885?
Stack consumption vulnerability in validators/DTD/DTDScanner.cpp in Apache Xerces C++ 2.7.0 and 2.8.0 allows context-dependent attackers to cause a denial of service (application crash) via vectors involving nested parentheses and invalid byte values in "simply nested DTD structures," as demonstrated by the Codenomicon XML fuzzing framework.
How severe is CVE-2009-1885?
Severity scoring for CVE-2009-1885 is pending analysis. The EPSS model estimates a 5.32% probability of exploitation in the next 30 days.
How do I fix CVE-2009-1885?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2009-1885?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST