CVE-2010-2597

UnknownEPSS 2.79%

Last modified

CVE-2010-2597 is a vulnerability of currently unknown severity. The TIFFVStripSize function in tif_strip.c in LibTIFF 3.9.0 and 3.9.2 makes incorrect calls to the TIFFGetField function, which allows remote attackers to cause a denial of service (application crash) via a crafted TIFF image, related to "downsampled OJPEG input" and possibly related to a compiler optimization that triggers a divide-by-zero error.. EPSS estimates a 2.79% chance of exploitation in the next 30 days.

Description

The TIFFVStripSize function in tif_strip.c in LibTIFF 3.9.0 and 3.9.2 makes incorrect calls to the TIFFGetField function, which allows remote attackers to cause a denial of service (application crash) via a crafted TIFF image, related to "downsampled OJPEG input" and possibly related to a compiler optimization that triggers a divide-by-zero error.

Metrics

EPSS Probability
2.79%

84.5th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
LibtiffLibtiff3.9.0
LibtiffLibtiff3.9.2

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2010-2597?
The TIFFVStripSize function in tif_strip.c in LibTIFF 3.9.0 and 3.9.2 makes incorrect calls to the TIFFGetField function, which allows remote attackers to cause a denial of service (application crash) via a crafted TIFF image, related to "downsampled OJPEG input" and possibly related to a compiler optimization that triggers a divide-by-zero error.
How severe is CVE-2010-2597?
Severity scoring for CVE-2010-2597 is pending analysis. The EPSS model estimates a 2.79% probability of exploitation in the next 30 days.
How do I fix CVE-2010-2597?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2010-2597?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST