CVE-2010-4115

Name: CVE-2010-4115
Creator: NVD / NIST
Published: 2010-12-17T19:00:20.963+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

UnknownEPSS 2.79%

Last modified Jun 16, 2026

CVE-2010-4115 is a vulnerability of currently unknown severity. HP StorageWorks Modular Smart Array P2000 G3 firmware TS100R011, TS100R025, TS100P002, TS200R005, TS201R014, and TS201R015 installs an undocumented admin account with a default "!admin" password, which allows remote attackers to gain privileges.. EPSS estimates a 2.79% chance of exploitation in the next 30 days.

Description

HP StorageWorks Modular Smart Array P2000 G3 firmware TS100R011, TS100R025, TS100P002, TS200R005, TS201R014, and TS201R015 installs an undocumented admin account with a default "!admin" password, which allows remote attackers to gain privileges.

Metrics

EPSS Probability

2.79%

84.6th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

CWE-255

Affected Software

Vendor	Product	Versions
Hp	Storageworks Modular Smart Array P2000 G3 Firmware	ts100p002
Hp	Storageworks Modular Smart Array P2000 G3 Firmware	ts100r011
Hp	Storageworks Modular Smart Array P2000 G3 Firmware	ts100r025
Hp	Storageworks Modular Smart Array P2000 G3 Firmware	ts200r005
Hp	Storageworks Modular Smart Array P2000 G3 Firmware	ts201r014
Hp	Storageworks Modular Smart Array P2000 G3 Firmware	ts201r015

References

Timeline

Published: Dec 17, 2010
Last Modified: Jun 16, 2026
Status: Modified

Frequently Asked Questions

What is CVE-2010-4115?

How severe is CVE-2010-4115?

Severity scoring for CVE-2010-4115 is pending analysis. The EPSS model estimates a 2.79% probability of exploitation in the next 30 days.

How do I fix CVE-2010-4115?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2010-4115?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST