CVE-2011-5318

Name: CVE-2011-5318
Creator: NVD / NIST
Published: 2015-01-01T11:59:22.537+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

UnknownEPSS 1.06%

Last modified Jun 16, 2026

CVE-2011-5318 is a vulnerability of currently unknown severity. Multiple cross-site request forgery (CSRF) vulnerabilities in diafan.CMS before 5.1 allow remote attackers to hijack the authentication of administrators for requests that (1) modify articles via a save_post action to admin/news/saveNEWS_ID/, (2) modify settings via a save_post action to admin/site/save2/, or (3) modify credentials via a save_post action to admin/usersite/save2/.. EPSS estimates a 1.06% chance of exploitation in the next 30 days.

Description

Multiple cross-site request forgery (CSRF) vulnerabilities in diafan.CMS before 5.1 allow remote attackers to hijack the authentication of administrators for requests that (1) modify articles via a save_post action to admin/news/saveNEWS_ID/, (2) modify settings via a save_post action to admin/site/save2/, or (3) modify credentials via a save_post action to admin/usersite/save2/.

Metrics

EPSS Probability

1.06%

60.2th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

CWE-352

Affected Software

Vendor	Product	Versions
Diafan	Diafan.Cms	<= 5.0

References

https://www.htbridge.com/advisory/HTB22775Exploit
https://www.htbridge.com/advisory/HTB22775Exploit

Timeline

Published: Jan 1, 2015
Last Modified: Jun 16, 2026
Status: Modified

Frequently Asked Questions

What is CVE-2011-5318?

How severe is CVE-2011-5318?

Severity scoring for CVE-2011-5318 is pending analysis. The EPSS model estimates a 1.06% probability of exploitation in the next 30 days.

How do I fix CVE-2011-5318?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2011-5318?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST