CVE-2012-0219

UnknownEPSS 0.46%

Last modified

CVE-2012-0219 is a vulnerability of currently unknown severity. Heap-based buffer overflow in the xioscan_readline function in xio-readline.c in socat 1.4.0.0 through 1.7.2.0 and 2.0.0-b1 through 2.0.0-b4 allows local users to execute arbitrary code via the READLINE address.. EPSS estimates a 0.46% chance of exploitation in the next 30 days.

Description

Heap-based buffer overflow in the xioscan_readline function in xio-readline.c in socat 1.4.0.0 through 1.7.2.0 and 2.0.0-b1 through 2.0.0-b4 allows local users to execute arbitrary code via the READLINE address.

Metrics

EPSS Probability
0.46%

36.1th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersionsUpdate
Dest-UnreachSocat1.4.0.0
Dest-UnreachSocat1.4.0.1
Dest-UnreachSocat1.4.0.2
Dest-UnreachSocat1.4.0.3
Dest-UnreachSocat1.4.1.0
Dest-UnreachSocat1.4.2.0
Dest-UnreachSocat1.4.3.1
Dest-UnreachSocat1.5.0.0
Dest-UnreachSocat1.6.0.0
Dest-UnreachSocat1.6.0.1
Dest-UnreachSocat1.7.0.0
Dest-UnreachSocat1.7.0.1
Dest-UnreachSocat1.7.1.0
Dest-UnreachSocat1.7.1.1
Dest-UnreachSocat1.7.1.2
Dest-UnreachSocat1.7.1.3
Dest-UnreachSocat1.7.2.0
Dest-UnreachSocat2.0.0B1

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2012-0219?
Heap-based buffer overflow in the xioscan_readline function in xio-readline.c in socat 1.4.0.0 through 1.7.2.0 and 2.0.0-b1 through 2.0.0-b4 allows local users to execute arbitrary code via the READLINE address.
How severe is CVE-2012-0219?
Severity scoring for CVE-2012-0219 is pending analysis. The EPSS model estimates a 0.46% probability of exploitation in the next 30 days.
How do I fix CVE-2012-0219?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2012-0219?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST