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CVE-2012-6422

UnknownEPSS 15.16%

Last modified

CVE-2012-6422 is a vulnerability of currently unknown severity. The kernel in Samsung Galaxy S2, Galaxy Note 2, MEIZU MX, and possibly other Android devices, when running an Exynos 4210 or 4412 processor, uses weak permissions (0666) for /dev/exynos-mem, which allows attackers to read or write arbitrary physical memory and gain privileges via a crafted application, as demonstrated by ExynosAbuse.. EPSS estimates a 15.16% chance of exploitation in the next 30 days.

Description

The kernel in Samsung Galaxy S2, Galaxy Note 2, MEIZU MX, and possibly other Android devices, when running an Exynos 4210 or 4412 processor, uses weak permissions (0666) for /dev/exynos-mem, which allows attackers to read or write arbitrary physical memory and gain privileges via a crafted application, as demonstrated by ExynosAbuse.

Metrics

EPSS Probability
15.16%

96.3th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
MeizuMxAll versions
SamsungGalaxy Note 2All versions
SamsungGalaxy S2All versions

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2012-6422?
The kernel in Samsung Galaxy S2, Galaxy Note 2, MEIZU MX, and possibly other Android devices, when running an Exynos 4210 or 4412 processor, uses weak permissions (0666) for /dev/exynos-mem, which allows attackers to read or write arbitrary physical memory and gain privileges via a crafted application, as demonstrated by ExynosAbuse.
How severe is CVE-2012-6422?
Severity scoring for CVE-2012-6422 is pending analysis. The EPSS model estimates a 15.16% probability of exploitation in the next 30 days.
How do I fix CVE-2012-6422?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2012-6422?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST