CVE-2014-0808

Name: CVE-2014-0808
Creator: NVD / NIST
Published: 2014-01-22T21:55:03.717+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

CRITICALCVSS 9.1/10EPSS 2.25%

Last modified Jun 17, 2026

CVE-2014-0808 is a critical-severity vulnerability rated 9.1/10 on the CVSS scale. Authorization bypass through user-controlled key issue exists in EC-CUBE 2.11.0 through 2.12.2 and EC-Orange systems deployed before June 29th, 2015. If this vulnerability is exploited, a user of the affected shopping website may obtain other users' information by sending a crafted HTTP request.. EPSS estimates a 2.25% chance of exploitation in the next 30 days.

Description

Authorization bypass through user-controlled key issue exists in EC-CUBE 2.11.0 through 2.12.2 and EC-Orange systems deployed before June 29th, 2015. If this vulnerability is exploited, a user of the affected shopping website may obtain other users' information by sending a crafted HTTP request.

Metrics

CVSS 3.1

9.1/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:N

EPSS Probability

2.25%

80.6th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

CWE-566

Affected Software

Vendor	Product	Versions
Lockon	Ec-Cube	2.11.0
Lockon	Ec-Cube	2.11.1
Lockon	Ec-Cube	2.11.2
Lockon	Ec-Cube	2.11.3
Lockon	Ec-Cube	2.11.4
Lockon	Ec-Cube	2.11.5
Lockon	Ec-Cube	2.12.0
Lockon	Ec-Cube	2.12.1
Lockon	Ec-Cube	2.12.2

References

Timeline

Published: Jan 22, 2014
Last Modified: Jun 17, 2026
Status: Modified

Frequently Asked Questions

What is CVE-2014-0808?

How severe is CVE-2014-0808?

CVE-2014-0808 has a CVSS score of 9.1/10 (CRITICAL severity). The EPSS model estimates a 2.25% probability of exploitation in the next 30 days.

How do I fix CVE-2014-0808?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2014-0808?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST