CVE-2015-3322

UnknownEPSS 0.71%

Last modified

CVE-2015-3322 is a vulnerability of currently unknown severity. Lenovo ThinkServer RD350, RD450, RD550, RD650, and TD350 servers before 1.26.0 use weak encryption to store (1) user and (2) administrator BIOS passwords, which allows attackers to decrypt the passwords via unspecified vectors.. EPSS estimates a 0.71% chance of exploitation in the next 30 days.

Description

Lenovo ThinkServer RD350, RD450, RD550, RD650, and TD350 servers before 1.26.0 use weak encryption to store (1) user and (2) administrator BIOS passwords, which allows attackers to decrypt the passwords via unspecified vectors.

Metrics

EPSS Probability
0.71%

48.9th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
LenovoThinkserver Rd650 Firmware<= 1.25.0
LenovoThinkserver Rd650All versions
LenovoThinkserver Td350 Firmware<= 1.25.0
LenovoThinkserver Td350All versions
LenovoThinkserver Rd350 Firmware<= 1.25.0
LenovoThinkserver Rd350All versions
LenovoThinkserver Rd550 Firmware<= 1.25.0
LenovoThinkserver Rd550All versions
LenovoThinkserver Rd450 Firmware<= 1.25.0
LenovoThinkserver Rd450All versions

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2015-3322?
Lenovo ThinkServer RD350, RD450, RD550, RD650, and TD350 servers before 1.26.0 use weak encryption to store (1) user and (2) administrator BIOS passwords, which allows attackers to decrypt the passwords via unspecified vectors.
How severe is CVE-2015-3322?
Severity scoring for CVE-2015-3322 is pending analysis. The EPSS model estimates a 0.71% probability of exploitation in the next 30 days.
How do I fix CVE-2015-3322?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2015-3322?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST