CVE-2015-3693

UnknownEPSS 7.66%

Last modified

CVE-2015-3693 is a vulnerability of currently unknown severity. Apple Mac EFI before 2015-001, as used in OS X before 10.10.4 and other products, does not properly set refresh rates for DDR3 RAM, which might make it easier for remote attackers to conduct row-hammer attacks, and consequently gain privileges or cause a denial of service (memory corruption), by triggering certain patterns of access to memory locations.. EPSS estimates a 7.66% chance of exploitation in the next 30 days.

Description

Apple Mac EFI before 2015-001, as used in OS X before 10.10.4 and other products, does not properly set refresh rates for DDR3 RAM, which might make it easier for remote attackers to conduct row-hammer attacks, and consequently gain privileges or cause a denial of service (memory corruption), by triggering certain patterns of access to memory locations.

Metrics

EPSS Probability
7.66%

93.8th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
AppleMac Os X<= 10.10.3

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2015-3693?
Apple Mac EFI before 2015-001, as used in OS X before 10.10.4 and other products, does not properly set refresh rates for DDR3 RAM, which might make it easier for remote attackers to conduct row-hammer attacks, and consequently gain privileges or cause a denial of service (memory corruption), by triggering certain patterns of access to memory locations.
How severe is CVE-2015-3693?
Severity scoring for CVE-2015-3693 is pending analysis. The EPSS model estimates a 7.66% probability of exploitation in the next 30 days.
How do I fix CVE-2015-3693?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2015-3693?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST