CVE-2015-6244

UnknownEPSS 3.24%

Last modified

CVE-2015-6244 is a vulnerability of currently unknown severity. The dissect_zbee_secure function in epan/dissectors/packet-zbee-security.c in the ZigBee dissector in Wireshark 1.12.x before 1.12.7 improperly relies on length fields contained in packet data, which allows remote attackers to cause a denial of service (application crash) via a crafted packet.. EPSS estimates a 3.24% chance of exploitation in the next 30 days.

Description

The dissect_zbee_secure function in epan/dissectors/packet-zbee-security.c in the ZigBee dissector in Wireshark 1.12.x before 1.12.7 improperly relies on length fields contained in packet data, which allows remote attackers to cause a denial of service (application crash) via a crafted packet.

Metrics

EPSS Probability
3.24%

86.7th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
WiresharkWireshark1.12.0
WiresharkWireshark1.12.1
WiresharkWireshark1.12.2
WiresharkWireshark1.12.3
WiresharkWireshark1.12.4
WiresharkWireshark1.12.5
WiresharkWireshark1.12.6
OracleLinux7
OracleSolaris11.3

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2015-6244?
The dissect_zbee_secure function in epan/dissectors/packet-zbee-security.c in the ZigBee dissector in Wireshark 1.12.x before 1.12.7 improperly relies on length fields contained in packet data, which allows remote attackers to cause a denial of service (application crash) via a crafted packet.
How severe is CVE-2015-6244?
Severity scoring for CVE-2015-6244 is pending analysis. The EPSS model estimates a 3.24% probability of exploitation in the next 30 days.
How do I fix CVE-2015-6244?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2015-6244?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST