CVE-2015-7854

HIGHCVSS 8.8/10EPSS 14.56%

Last modified

CVE-2015-7854 is a high-severity vulnerability rated 8.8/10 on the CVSS scale. Buffer overflow in the password management functionality in NTP 4.2.x before 4.2.8p4, and 4.3.x before 4.3.77 allows remote authenticated users to cause a denial of service (daemon crash) or possibly execute arbitrary code via a crafted key file.. EPSS estimates a 14.56% chance of exploitation in the next 30 days.

Description

Buffer overflow in the password management functionality in NTP 4.2.x before 4.2.8p4, and 4.3.x before 4.3.77 allows remote authenticated users to cause a denial of service (daemon crash) or possibly execute arbitrary code via a crafted key file.

Metrics

CVSS 3.1
8.8/10

CVSS:3.1/AV:N/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H

EPSS Probability
14.56%

96.2th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
NtpNtp>= 4.2.0, < 4.2.8
NtpNtp>= 4.3.0, < 4.3.77
NtpNtp4.2.8
NetappOncommand BalanceAll versions
NetappOncommand Performance ManagerAll versions
NetappOncommand Unified ManagerAll versions
NetappClustered Data OntapAll versions
NetappData OntapAll versions

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2015-7854?
Buffer overflow in the password management functionality in NTP 4.2.x before 4.2.8p4, and 4.3.x before 4.3.77 allows remote authenticated users to cause a denial of service (daemon crash) or possibly execute arbitrary code via a crafted key file.
How severe is CVE-2015-7854?
CVE-2015-7854 has a CVSS score of 8.8/10 (HIGH severity). The EPSS model estimates a 14.56% probability of exploitation in the next 30 days.
How do I fix CVE-2015-7854?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2015-7854?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST