CVE-2015-8931

UnknownEPSS 2.13%

Last modified

CVE-2015-8931 is a vulnerability of currently unknown severity. Multiple integer overflows in the (1) get_time_t_max and (2) get_time_t_min functions in archive_read_support_format_mtree.c in libarchive before 3.2.0 allow remote attackers to have unspecified impact via a crafted mtree file, which triggers undefined behavior.. EPSS estimates a 2.13% chance of exploitation in the next 30 days.

Description

Multiple integer overflows in the (1) get_time_t_max and (2) get_time_t_min functions in archive_read_support_format_mtree.c in libarchive before 3.2.0 allow remote attackers to have unspecified impact via a crafted mtree file, which triggers undefined behavior.

Metrics

EPSS Probability
2.13%

79.6th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersionsUpdate
LibarchiveLibarchive<= 3.1.901a
SuseLinux Enterprise Desktop12Sp1
SuseLinux Enterprise Server12Sp1
SuseLinux Enterprise Software Development Kit12Sp1
CanonicalUbuntu Linux12.04
CanonicalUbuntu Linux14.04
CanonicalUbuntu Linux15.10
CanonicalUbuntu Linux16.04
DebianDebian Linux7.0
DebianDebian Linux8.0

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2015-8931?
Multiple integer overflows in the (1) get_time_t_max and (2) get_time_t_min functions in archive_read_support_format_mtree.c in libarchive before 3.2.0 allow remote attackers to have unspecified impact via a crafted mtree file, which triggers undefined behavior.
How severe is CVE-2015-8931?
Severity scoring for CVE-2015-8931 is pending analysis. The EPSS model estimates a 2.13% probability of exploitation in the next 30 days.
How do I fix CVE-2015-8931?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2015-8931?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST