CVE-2016-0281

UnknownEPSS 8.42%

Last modified

CVE-2016-0281 is a vulnerability of currently unknown severity. The mustendd driver in IBM AIX 5.3, 6.1, 7.1, and 7.2 and VIOS 2.2.x, when the jumbo_frames feature is not enabled, allows remote attackers to cause a denial of service (FC1763 or FC5899 adapter crash) via crafted packets.. EPSS estimates a 8.42% chance of exploitation in the next 30 days.

Description

The mustendd driver in IBM AIX 5.3, 6.1, 7.1, and 7.2 and VIOS 2.2.x, when the jumbo_frames feature is not enabled, allows remote attackers to cause a denial of service (FC1763 or FC5899 adapter crash) via crafted packets.

Metrics

EPSS Probability
8.42%

94.3th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
IbmAix5.3
IbmAix6.1
IbmAix7.1
IbmAix7.2
IbmVios2.2.0.10
IbmVios2.2.0.11
IbmVios2.2.0.12
IbmVios2.2.0.13
IbmVios2.2.1.0
IbmVios2.2.1.1
IbmVios2.2.1.3
IbmVios2.2.1.4
IbmVios2.2.1.5
IbmVios2.2.1.6
IbmVios2.2.1.7
IbmVios2.2.1.8
IbmVios2.2.1.9
IbmVios2.2.2.0
IbmVios2.2.2.1
IbmVios2.2.2.2
IbmVios2.2.2.3
IbmVios2.2.2.4
IbmVios2.2.2.5
IbmVios2.2.3.0
IbmVios2.2.3.1
IbmVios2.2.3.2
IbmVios2.2.3.3
IbmVios2.2.3.4

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2016-0281?
The mustendd driver in IBM AIX 5.3, 6.1, 7.1, and 7.2 and VIOS 2.2.x, when the jumbo_frames feature is not enabled, allows remote attackers to cause a denial of service (FC1763 or FC5899 adapter crash) via crafted packets.
How severe is CVE-2016-0281?
Severity scoring for CVE-2016-0281 is pending analysis. The EPSS model estimates a 8.42% probability of exploitation in the next 30 days.
How do I fix CVE-2016-0281?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2016-0281?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST