CVE-2016-0808

UnknownEPSS 0.18%

Last modified

CVE-2016-0808 is a vulnerability of currently unknown severity. Integer overflow in the getCoverageFormat12 function in CmapCoverage.cpp in the Minikin library in Android 5.x before 5.1.1 LMY49G and 6.x before 2016-02-01 allows attackers to cause a denial of service (continuous rebooting) via an application that triggers loading of a crafted TTF font, aka internal bug 25645298.. EPSS estimates a 0.18% chance of exploitation in the next 30 days.

Description

Integer overflow in the getCoverageFormat12 function in CmapCoverage.cpp in the Minikin library in Android 5.x before 5.1.1 LMY49G and 6.x before 2016-02-01 allows attackers to cause a denial of service (continuous rebooting) via an application that triggers loading of a crafted TTF font, aka internal bug 25645298.

Metrics

EPSS Probability
0.18%

7.7th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
GoogleAndroid5.0
GoogleAndroid5.0.1
GoogleAndroid5.0.2
GoogleAndroid5.1
GoogleAndroid5.1.0
GoogleAndroid5.1.1
GoogleAndroid6.0
GoogleAndroid6.0.1

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2016-0808?
Integer overflow in the getCoverageFormat12 function in CmapCoverage.cpp in the Minikin library in Android 5.x before 5.1.1 LMY49G and 6.x before 2016-02-01 allows attackers to cause a denial of service (continuous rebooting) via an application that triggers loading of a crafted TTF font, aka internal bug 25645298.
How severe is CVE-2016-0808?
Severity scoring for CVE-2016-0808 is pending analysis. The EPSS model estimates a 0.18% probability of exploitation in the next 30 days.
How do I fix CVE-2016-0808?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2016-0808?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST