CVE-2016-10164

UnknownEPSS 7.53%

Last modified

CVE-2016-10164 is a vulnerability of currently unknown severity. Multiple integer overflows in libXpm before 3.5.12, when a program requests parsing XPM extensions on a 64-bit platform, allow remote attackers to cause a denial of service (out-of-bounds write) or execute arbitrary code via (1) the number of extensions or (2) their concatenated length in a crafted XPM file, which triggers a heap-based buffer overflow.. EPSS estimates a 7.53% chance of exploitation in the next 30 days.

Description

Multiple integer overflows in libXpm before 3.5.12, when a program requests parsing XPM extensions on a 64-bit platform, allow remote attackers to cause a denial of service (out-of-bounds write) or execute arbitrary code via (1) the number of extensions or (2) their concatenated length in a crafted XPM file, which triggers a heap-based buffer overflow.

Metrics

EPSS Probability
7.53%

93.7th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
X.OrgLibxpm<= 3.5.11

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2016-10164?
Multiple integer overflows in libXpm before 3.5.12, when a program requests parsing XPM extensions on a 64-bit platform, allow remote attackers to cause a denial of service (out-of-bounds write) or execute arbitrary code via (1) the number of extensions or (2) their concatenated length in a crafted XPM file, which triggers a heap-based buffer overflow.
How severe is CVE-2016-10164?
Severity scoring for CVE-2016-10164 is pending analysis. The EPSS model estimates a 7.53% probability of exploitation in the next 30 days.
How do I fix CVE-2016-10164?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2016-10164?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST