CVE-2016-11017

CRITICALCVSS 9.8/10EPSS 4.39%

Last modified

CVE-2016-11017 is a critical-severity vulnerability rated 9.8/10 on the CVSS scale. The application login page in AKIPS Network Monitor 15.37 through 16.5 allows a remote unauthenticated attacker to execute arbitrary OS commands via shell metacharacters in the username parameter (a failed login attempt returns the command-injection output to a limited login failure field). This is fixed in 16.6.. EPSS estimates a 4.39% chance of exploitation in the next 30 days.

Description

The application login page in AKIPS Network Monitor 15.37 through 16.5 allows a remote unauthenticated attacker to execute arbitrary OS commands via shell metacharacters in the username parameter (a failed login attempt returns the command-injection output to a limited login failure field). This is fixed in 16.6.

Metrics

CVSS 3.1
9.8/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H

EPSS Probability
4.39%

90.1th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
AkipsNetwork Monitor>= 15.37, <= 16.5

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2016-11017?
The application login page in AKIPS Network Monitor 15.37 through 16.5 allows a remote unauthenticated attacker to execute arbitrary OS commands via shell metacharacters in the username parameter (a failed login attempt returns the command-injection output to a limited login failure field). This is fixed in 16.6.
How severe is CVE-2016-11017?
CVE-2016-11017 has a CVSS score of 9.8/10 (CRITICAL severity). The EPSS model estimates a 4.39% probability of exploitation in the next 30 days.
How do I fix CVE-2016-11017?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2016-11017?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST