CVE-2016-11030

Name: CVE-2016-11030
Creator: NVD / NIST
Published: 2020-04-07T14:15:13.043+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

HIGHCVSS 8.1/10EPSS 0.31%

Last modified Jun 17, 2026

CVE-2016-11030 is a high-severity vulnerability rated 8.1/10 on the CVSS scale. An issue was discovered on Samsung mobile devices with KK(4.4), L(5.0/5.1), and M(6.0) (with Hrm sensor support) software. The sysfs of the MAX86902 sensor driver does not prevent concurrent access, leading to a race condition and resultant heap-based buffer overflow. EPSS estimates a 0.31% chance of exploitation in the next 30 days.

Description

An issue was discovered on Samsung mobile devices with KK(4.4), L(5.0/5.1), and M(6.0) (with Hrm sensor support) software. The sysfs of the MAX86902 sensor driver does not prevent concurrent access, leading to a race condition and resultant heap-based buffer overflow. The Samsung ID is SVE-2016-7341 (December 2016).

Metrics

CVSS 3.1

8.1/10

CVSS:3.1/AV:N/AC:H/PR:N/UI:N/S:U/C:H/I:H/A:H

EPSS Probability

0.31%

22.3th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

Vendor	Product	Versions
Google	Android	4.4
Google	Android	5.0
Google	Android	5.1
Google	Android	6.0

References

https://security.samsungmobile.com/securityUpdate.smsbVendor Advisory
https://security.samsungmobile.com/securityUpdate.smsbVendor Advisory

Timeline

Published: Apr 7, 2020
Last Modified: Jun 17, 2026
Status: Modified

Frequently Asked Questions

What is CVE-2016-11030?

How severe is CVE-2016-11030?

CVE-2016-11030 has a CVSS score of 8.1/10 (HIGH severity). The EPSS model estimates a 0.31% probability of exploitation in the next 30 days.

How do I fix CVE-2016-11030?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2016-11030?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST