CVE-2016-4006

UnknownEPSS 2.32%

Last modified

CVE-2016-4006 is a vulnerability of currently unknown severity. epan/proto.c in Wireshark 1.12.x before 1.12.11 and 2.0.x before 2.0.3 does not limit the protocol-tree depth, which allows remote attackers to cause a denial of service (stack memory consumption and application crash) via a crafted packet.. EPSS estimates a 2.32% chance of exploitation in the next 30 days.

Description

epan/proto.c in Wireshark 1.12.x before 1.12.11 and 2.0.x before 2.0.3 does not limit the protocol-tree depth, which allows remote attackers to cause a denial of service (stack memory consumption and application crash) via a crafted packet.

Metrics

EPSS Probability
2.32%

81.2th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
WiresharkWireshark1.12.0
WiresharkWireshark1.12.1
WiresharkWireshark1.12.2
WiresharkWireshark1.12.3
WiresharkWireshark1.12.4
WiresharkWireshark1.12.5
WiresharkWireshark1.12.6
WiresharkWireshark1.12.7
WiresharkWireshark1.12.8
WiresharkWireshark1.12.9
WiresharkWireshark1.12.10
WiresharkWireshark2.0.0
WiresharkWireshark2.0.1
WiresharkWireshark2.0.2

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2016-4006?
epan/proto.c in Wireshark 1.12.x before 1.12.11 and 2.0.x before 2.0.3 does not limit the protocol-tree depth, which allows remote attackers to cause a denial of service (stack memory consumption and application crash) via a crafted packet.
How severe is CVE-2016-4006?
Severity scoring for CVE-2016-4006 is pending analysis. The EPSS model estimates a 2.32% probability of exploitation in the next 30 days.
How do I fix CVE-2016-4006?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2016-4006?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST