CVE-2016-5418

UnknownEPSS 4.67%

Last modified

CVE-2016-5418 is a vulnerability of currently unknown severity. The sandboxing code in libarchive 3.2.0 and earlier mishandles hardlink archive entries of non-zero data size, which might allow remote attackers to write to arbitrary files via a crafted archive file.. EPSS estimates a 4.67% chance of exploitation in the next 30 days.

Description

The sandboxing code in libarchive 3.2.0 and earlier mishandles hardlink archive entries of non-zero data size, which might allow remote attackers to write to arbitrary files via a crafted archive file.

Metrics

EPSS Probability
4.67%

90.6th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
RedhatEnterprise Linux Desktop6.0
RedhatEnterprise Linux Hpc Node6.0
RedhatEnterprise Linux Server6.0
RedhatEnterprise Linux Workstation6.0
OracleLinux6
OracleLinux7
RedhatOpenshift3.1
RedhatOpenshift3.2
LibarchiveLibarchive<= 3.2.0
RedhatEnterprise Linux Desktop7.0
RedhatEnterprise Linux Hpc Node7.0
RedhatEnterprise Linux Hpc Node Eus7.2
RedhatEnterprise Linux Server7.0
RedhatEnterprise Linux Server Aus7.2
RedhatEnterprise Linux Server Eus7.2
RedhatEnterprise Linux Workstation7.0

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2016-5418?
The sandboxing code in libarchive 3.2.0 and earlier mishandles hardlink archive entries of non-zero data size, which might allow remote attackers to write to arbitrary files via a crafted archive file.
How severe is CVE-2016-5418?
Severity scoring for CVE-2016-5418 is pending analysis. The EPSS model estimates a 4.67% probability of exploitation in the next 30 days.
How do I fix CVE-2016-5418?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2016-5418?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST