CVE-2016-6192

Name: CVE-2016-6192
Creator: NVD / NIST
Published: 2016-08-02T16:59:05.29+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

UnknownEPSS 0.84%

Last modified Jun 17, 2026

CVE-2016-6192 is a vulnerability of currently unknown severity. Buffer overflow in the Wi-Fi driver in Huawei P8 smartphones with software before GRA-CL00C92B363 allows attackers to cause a denial of service (system crash) or gain privileges via a crafted application, a different vulnerability than CVE-2016-6193.. EPSS estimates a 0.84% chance of exploitation in the next 30 days.

Description

Buffer overflow in the Wi-Fi driver in Huawei P8 smartphones with software before GRA-CL00C92B363 allows attackers to cause a denial of service (system crash) or gain privileges via a crafted application, a different vulnerability than CVE-2016-6193.

Metrics

EPSS Probability

0.84%

53.0th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

CWE-264

Affected Software

Vendor	Product	Versions
Huawei	P8 Smartphone Firmware	<= gra-cl00c92b350

References

http://www.huawei.com/en/psirt/security-advisories/huawei-sa-20160708-01-smartphone-enVendor Advisory
http://www.securityfocus.com/bid/91735Third Party Advisory, VDB Entry
http://www.huawei.com/en/psirt/security-advisories/huawei-sa-20160708-01-smartphone-enVendor Advisory
http://www.securityfocus.com/bid/91735Third Party Advisory, VDB Entry

Timeline

Published: Aug 2, 2016
Last Modified: Jun 17, 2026
Status: Modified

Frequently Asked Questions

What is CVE-2016-6192?

How severe is CVE-2016-6192?

Severity scoring for CVE-2016-6192 is pending analysis. The EPSS model estimates a 0.84% probability of exploitation in the next 30 days.

How do I fix CVE-2016-6192?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2016-6192?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST