CVE-2016-7466

MEDIUMCVSS 6/10EPSS 0.42%

Last modified

CVE-2016-7466 is a medium-severity vulnerability rated 6/10 on the CVSS scale. Memory leak in the usb_xhci_exit function in hw/usb/hcd-xhci.c in QEMU (aka Quick Emulator), when the xhci uses msix, allows local guest OS administrators to cause a denial of service (memory consumption and possibly QEMU process crash) by repeatedly unplugging a USB device.. EPSS estimates a 0.42% chance of exploitation in the next 30 days.

Description

Memory leak in the usb_xhci_exit function in hw/usb/hcd-xhci.c in QEMU (aka Quick Emulator), when the xhci uses msix, allows local guest OS administrators to cause a denial of service (memory consumption and possibly QEMU process crash) by repeatedly unplugging a USB device.

Metrics

CVSS 3.1
6/10

CVSS:3.1/AV:L/AC:L/PR:H/UI:N/S:C/C:N/I:N/A:H

EPSS Probability
0.42%

33.7th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
QemuQemu<= 2.7.1
OpensuseLeap42.2
RedhatOpenstack6.0
RedhatOpenstack7.0
RedhatOpenstack8
RedhatOpenstack9
RedhatOpenstack10
RedhatOpenstack11
RedhatVirtualization4.0

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2016-7466?
Memory leak in the usb_xhci_exit function in hw/usb/hcd-xhci.c in QEMU (aka Quick Emulator), when the xhci uses msix, allows local guest OS administrators to cause a denial of service (memory consumption and possibly QEMU process crash) by repeatedly unplugging a USB device.
How severe is CVE-2016-7466?
CVE-2016-7466 has a CVSS score of 6/10 (MEDIUM severity). The EPSS model estimates a 0.42% probability of exploitation in the next 30 days.
How do I fix CVE-2016-7466?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2016-7466?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST