CVE-2017-0176

UnknownEPSS 45.93%

Last modified

CVE-2017-0176 is a vulnerability of currently unknown severity. A buffer overflow in Smart Card authentication code in gpkcsp.dll in Microsoft Windows XP through SP3 and Server 2003 through SP2 allows a remote attacker to execute arbitrary code on the target computer, provided that the computer is joined in a Windows domain and has Remote Desktop Protocol connectivity (or Terminal Services) enabled.. EPSS estimates a 45.93% chance of exploitation in the next 30 days.

Description

A buffer overflow in Smart Card authentication code in gpkcsp.dll in Microsoft Windows XP through SP3 and Server 2003 through SP2 allows a remote attacker to execute arbitrary code on the target computer, provided that the computer is joined in a Windows domain and has Remote Desktop Protocol connectivity (or Terminal Services) enabled.

Metrics

EPSS Probability
45.93%

98.6th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
MicrosoftWindows Server 2003All versions
MicrosoftWindows XpAll versions

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2017-0176?
A buffer overflow in Smart Card authentication code in gpkcsp.dll in Microsoft Windows XP through SP3 and Server 2003 through SP2 allows a remote attacker to execute arbitrary code on the target computer, provided that the computer is joined in a Windows domain and has Remote Desktop Protocol connectivity (or Terminal Services) enabled.
How severe is CVE-2017-0176?
Severity scoring for CVE-2017-0176 is pending analysis. The EPSS model estimates a 45.93% probability of exploitation in the next 30 days.
How do I fix CVE-2017-0176?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2017-0176?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST