CVE-2017-0621

Name: CVE-2017-0621
Creator: NVD / NIST
Published: 2017-05-12T15:29:02.313+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

UnknownEPSS 1.47%

Last modified Jun 17, 2026

CVE-2017-0621 is a vulnerability of currently unknown severity. An elevation of privilege vulnerability in the Qualcomm camera driver could enable a local malicious application to execute arbitrary code within the context of the kernel. This issue is rated as High because it first requires compromising a privileged process. EPSS estimates a 1.47% chance of exploitation in the next 30 days.

Description

An elevation of privilege vulnerability in the Qualcomm camera driver could enable a local malicious application to execute arbitrary code within the context of the kernel. This issue is rated as High because it first requires compromising a privileged process. Product: Android. Versions: Kernel-3.10. Android ID: A-35399703. References: QC-CR#831322.

Metrics

EPSS Probability

1.47%

70.3th percentile

Probability of exploitation in the next 30 days. Learn more

Affected Software

Vendor	Product	Versions
Linux	Linux Kernel	3.10

References

http://www.securityfocus.com/bid/98196Third Party Advisory, VDB Entry
https://source.android.com/security/bulletin/2017-05-01Patch, Vendor Advisory
http://www.securityfocus.com/bid/98196Third Party Advisory, VDB Entry
https://source.android.com/security/bulletin/2017-05-01Patch, Vendor Advisory

Timeline

Published: May 12, 2017
Last Modified: Jun 17, 2026
Status: Modified

Frequently Asked Questions

What is CVE-2017-0621?

How severe is CVE-2017-0621?

Severity scoring for CVE-2017-0621 is pending analysis. The EPSS model estimates a 1.47% probability of exploitation in the next 30 days.

How do I fix CVE-2017-0621?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2017-0621?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST