CVE-2017-0889
UnknownEPSS 3.05%
Last modified
CVE-2017-0889 is a vulnerability of currently unknown severity. Paperclip ruby gem version 3.1.4 and later suffers from a Server-SIde Request Forgery (SSRF) vulnerability in the Paperclip::UriAdapter class. Attackers may be able to access information about internal network resources.. EPSS estimates a 3.05% chance of exploitation in the next 30 days.
Description
Paperclip ruby gem version 3.1.4 and later suffers from a Server-SIde Request Forgery (SSRF) vulnerability in the Paperclip::UriAdapter class. Attackers may be able to access information about internal network resources.
Metrics
Weakness Enumeration
Affected Software
| Vendor | Product | Versions |
|---|---|---|
| Thoughtbot | Paperclip | >= 3.1.4, < 5.2.0 |
References
- https://github.com/thoughtbot/paperclip/pull/2435Issue Tracking, Patch, Third Party Advisory
- https://hackerone.com/reports/209430Permissions Required
- https://hackerone.com/reports/713Issue Tracking, Third Party Advisory
- https://github.com/thoughtbot/paperclip/pull/2435Issue Tracking, Patch, Third Party Advisory
- https://hackerone.com/reports/209430Permissions Required
- https://hackerone.com/reports/713Issue Tracking, Third Party Advisory
Timeline
- Published
- Last Modified
- Status
- Modified
Frequently Asked Questions
What is CVE-2017-0889?
Paperclip ruby gem version 3.1.4 and later suffers from a Server-SIde Request Forgery (SSRF) vulnerability in the Paperclip::UriAdapter class. Attackers may be able to access information about internal network resources.
How severe is CVE-2017-0889?
Severity scoring for CVE-2017-0889 is pending analysis. The EPSS model estimates a 3.05% probability of exploitation in the next 30 days.
How do I fix CVE-2017-0889?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.
Are you affected by CVE-2017-0889?
Run a free Strix scan to check your systems for this vulnerability.
Scan your code nowSource: NVD / NIST