CVE-2017-10996

Name: CVE-2017-10996
Creator: NVD / NIST
Published: 2017-09-21T15:29:00.18+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

UnknownEPSS 0.43%

Last modified Jun 17, 2026

CVE-2017-10996 is a vulnerability of currently unknown severity. In all Qualcomm products with Android releases from CAF using the Linux kernel, out of bounds access is possible in c_show(), due to compat_hwcap_str[] not being NULL-terminated. This error is not fatal, however the device might crash/reboot with memory violation/out of bounds access.. EPSS estimates a 0.43% chance of exploitation in the next 30 days.

Description

In all Qualcomm products with Android releases from CAF using the Linux kernel, out of bounds access is possible in c_show(), due to compat_hwcap_str[] not being NULL-terminated. This error is not fatal, however the device might crash/reboot with memory violation/out of bounds access.

Metrics

EPSS Probability

0.43%

34.5th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

CWE-200

Affected Software

Vendor	Product	Versions
Google	Android	<= 8.0

References

http://www.securityfocus.com/bid/100658Third Party Advisory, VDB Entry
https://source.android.com/security/bulletin/2017-09-01Patch, Vendor Advisory
http://www.securityfocus.com/bid/100658Third Party Advisory, VDB Entry
https://source.android.com/security/bulletin/2017-09-01Patch, Vendor Advisory

Timeline

Published: Sep 21, 2017
Last Modified: Jun 17, 2026
Status: Modified

Frequently Asked Questions

What is CVE-2017-10996?

How severe is CVE-2017-10996?

Severity scoring for CVE-2017-10996 is pending analysis. The EPSS model estimates a 0.43% probability of exploitation in the next 30 days.

How do I fix CVE-2017-10996?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2017-10996?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST