CVE-2017-12881

Name: CVE-2017-12881
Creator: NVD / NIST
Published: 2017-08-18T18:29:03.22+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

UnknownEPSS 0.79%

Last modified Jun 17, 2026

CVE-2017-12881 is a vulnerability of currently unknown severity. Cross-site request forgery (CSRF) vulnerability in the Spring Batch Admin before 1.3.0 allows remote attackers to hijack the authentication of unspecified victims and submit arbitrary requests, such as exploiting the file upload vulnerability.. EPSS estimates a 0.79% chance of exploitation in the next 30 days.

Description

Cross-site request forgery (CSRF) vulnerability in the Spring Batch Admin before 1.3.0 allows remote attackers to hijack the authentication of unspecified victims and submit arbitrary requests, such as exploiting the file upload vulnerability.

Metrics

EPSS Probability

0.79%

51.7th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

CWE-352

Affected Software

Vendor	Product	Versions
Spring Batch Admin Project	Spring Batch Admin	<= 1.2.1

References

http://www.openwall.com/lists/oss-security/2017/08/16/5Mailing List, Third Party Advisory
http://www.securityfocus.com/bid/100410Third Party Advisory, VDB Entry
http://www.openwall.com/lists/oss-security/2017/08/16/5Mailing List, Third Party Advisory
http://www.securityfocus.com/bid/100410Third Party Advisory, VDB Entry

Timeline

Published: Aug 18, 2017
Last Modified: Jun 17, 2026
Status: Modified

Frequently Asked Questions

What is CVE-2017-12881?

How severe is CVE-2017-12881?

Severity scoring for CVE-2017-12881 is pending analysis. The EPSS model estimates a 0.79% probability of exploitation in the next 30 days.

How do I fix CVE-2017-12881?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2017-12881?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST