CVE-2017-15385

Name: CVE-2017-15385
Creator: NVD / NIST
Published: 2017-10-16T22:29:00.203+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

UnknownEPSS 1.03%

Last modified Jun 17, 2026

CVE-2017-15385 is a vulnerability of currently unknown severity. The store_versioninfo_gnu_verdef function in libr/bin/format/elf/elf.c in radare2 2.0.0 allows remote attackers to cause a denial of service (r_read_le16 invalid write and application crash) or possibly have unspecified other impact via a crafted ELF file.. EPSS estimates a 1.03% chance of exploitation in the next 30 days.

Description

The store_versioninfo_gnu_verdef function in libr/bin/format/elf/elf.c in radare2 2.0.0 allows remote attackers to cause a denial of service (r_read_le16 invalid write and application crash) or possibly have unspecified other impact via a crafted ELF file.

Metrics

EPSS Probability

1.03%

59.4th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

CWE-119

Affected Software

Vendor	Product	Versions
Radare	Radare2	2.0.0

References

https://github.com/radare/radare2/commit/21a6f570ba33fa9f52f1bba87f07acc4e8c178f4Patch, Third Party Advisory
https://github.com/radare/radare2/issues/8685Third Party Advisory
https://github.com/radare/radare2/commit/21a6f570ba33fa9f52f1bba87f07acc4e8c178f4Patch, Third Party Advisory
https://github.com/radare/radare2/issues/8685Third Party Advisory

Timeline

Published: Oct 16, 2017
Last Modified: Jun 17, 2026
Status: Modified

Frequently Asked Questions

What is CVE-2017-15385?

How severe is CVE-2017-15385?

Severity scoring for CVE-2017-15385 is pending analysis. The EPSS model estimates a 1.03% probability of exploitation in the next 30 days.

How do I fix CVE-2017-15385?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2017-15385?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST