CVE-2017-16137
UnknownEPSS 2.80%
Last modified
CVE-2017-16137 is a vulnerability of currently unknown severity. The debug module is vulnerable to regular expression denial of service when untrusted user input is passed into the o formatter. It takes around 50k characters to block for 2 seconds making this a low severity issue.. EPSS estimates a 2.80% chance of exploitation in the next 30 days.
Description
The debug module is vulnerable to regular expression denial of service when untrusted user input is passed into the o formatter. It takes around 50k characters to block for 2 seconds making this a low severity issue.
Metrics
Weakness Enumeration
Affected Software
| Vendor | Product | Versions |
|---|---|---|
| Debug Project | Debug | >= 2.0.0, < 2.6.9 |
| Debug Project | Debug | >= 3.0.0, < 3.1.0 |
References
- https://github.com/visionmedia/debug/issues/501Third Party Advisory
- https://github.com/visionmedia/debug/pull/504Patch, Third Party Advisory
- https://nodesecurity.io/advisories/534Third Party Advisory
- https://github.com/visionmedia/debug/issues/501Third Party Advisory
- https://github.com/visionmedia/debug/pull/504Patch, Third Party Advisory
- https://nodesecurity.io/advisories/534Third Party Advisory
Timeline
- Published
- Last Modified
- Status
- Modified
Frequently Asked Questions
What is CVE-2017-16137?
The debug module is vulnerable to regular expression denial of service when untrusted user input is passed into the o formatter. It takes around 50k characters to block for 2 seconds making this a low severity issue.
How severe is CVE-2017-16137?
Severity scoring for CVE-2017-16137 is pending analysis. The EPSS model estimates a 2.80% probability of exploitation in the next 30 days.
How do I fix CVE-2017-16137?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.
Are you affected by CVE-2017-16137?
Run a free Strix scan to check your systems for this vulnerability.
Scan your code nowSource: NVD / NIST
