CVE-2017-17765

Name: CVE-2017-17765
Creator: NVD / NIST
Published: 2018-02-23T23:29:00.813+00:00
License: https://creativecommons.org/publicdomain/zero/1.0/

UnknownEPSS 0.18%

Last modified Jun 17, 2026

CVE-2017-17765 is a vulnerability of currently unknown severity. In all Qualcomm products with Android releases from CAF using the Linux kernel, multiple values received from firmware are not properly validated in wma_get_ll_stats_ext_buf() and are used to allocate the sizes of buffers and may be vulnerable to integer overflow leading to buffer overflow.. EPSS estimates a 0.18% chance of exploitation in the next 30 days.

Description

In all Qualcomm products with Android releases from CAF using the Linux kernel, multiple values received from firmware are not properly validated in wma_get_ll_stats_ext_buf() and are used to allocate the sizes of buffers and may be vulnerable to integer overflow leading to buffer overflow.

Metrics

EPSS Probability

0.18%

7.8th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

CWE-190

Affected Software

Vendor	Product	Versions
Google	Android	All versions

References

http://www.securityfocus.com/bid/102974Third Party Advisory, VDB Entry
https://source.android.com/security/bulletin/2018-02-01Vendor Advisory
http://www.securityfocus.com/bid/102974Third Party Advisory, VDB Entry
https://source.android.com/security/bulletin/2018-02-01Vendor Advisory

Timeline

Published: Feb 23, 2018
Last Modified: Jun 17, 2026
Status: Modified

Frequently Asked Questions

What is CVE-2017-17765?

How severe is CVE-2017-17765?

Severity scoring for CVE-2017-17765 is pending analysis. The EPSS model estimates a 0.18% probability of exploitation in the next 30 days.

How do I fix CVE-2017-17765?

Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2017-17765?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST