CVE-2017-18678

HIGHCVSS 7.5/10EPSS 0.41%

Last modified

CVE-2017-18678 is a high-severity vulnerability rated 7.5/10 on the CVSS scale. An issue was discovered on Samsung mobile devices with KK(4.4), L(5.0/5.1), M(6.0), and N(7.x) software. An attacker can crash system processes via a Serializable object because of missing exception handling. EPSS estimates a 0.41% chance of exploitation in the next 30 days.

Description

An issue was discovered on Samsung mobile devices with KK(4.4), L(5.0/5.1), M(6.0), and N(7.x) software. An attacker can crash system processes via a Serializable object because of missing exception handling. The Samsung IDs are SVE-2017-8109, SVE-2017-8110, SVE-2017-8115, SVE-2017-8118, and SVE-2017-8119 (April 2017).

Metrics

CVSS 3.1
7.5/10

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:N/I:N/A:H

EPSS Probability
0.41%

33.1th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
GoogleAndroid4.4
GoogleAndroid5.0
GoogleAndroid5.1
GoogleAndroid6.0
GoogleAndroid7.0
GoogleAndroid7.1.0
GoogleAndroid7.1.1
GoogleAndroid7.1.2

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2017-18678?
An issue was discovered on Samsung mobile devices with KK(4.4), L(5.0/5.1), M(6.0), and N(7.x) software. An attacker can crash system processes via a Serializable object because of missing exception handling. The Samsung IDs are SVE-2017-8109, SVE-2017-8110, SVE-2017-8115, SVE-2017-8118, and SVE-2017-8119 (April 2017).
How severe is CVE-2017-18678?
CVE-2017-18678 has a CVSS score of 7.5/10 (HIGH severity). The EPSS model estimates a 0.41% probability of exploitation in the next 30 days.
How do I fix CVE-2017-18678?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2017-18678?

Run a free Strix scan to check your systems for this vulnerability.

Scan your code now

Source: NVD / NIST