CVE-2017-2531
UnknownEPSS 6.57%
Last modified
CVE-2017-2531 is a vulnerability of currently unknown severity. An issue was discovered in certain Apple products. iOS before 10.3.2 is affected. EPSS estimates a 6.57% chance of exploitation in the next 30 days.
Description
An issue was discovered in certain Apple products. iOS before 10.3.2 is affected. Safari before 10.1.1 is affected. tvOS before 10.2.1 is affected. The issue involves the "WebKit" component. It allows remote attackers to execute arbitrary code or cause a denial of service (memory corruption and application crash) via a crafted web site.
Metrics
Weakness Enumeration
Affected Software
| Vendor | Product | Versions |
|---|---|---|
| Apple | Safari | <= 10.1 |
| Apple | Iphone Os | <= 10.3.1 |
| Apple | Tvos | <= 10.2 |
References
- https://support.apple.com/HT207798Vendor Advisory
- https://support.apple.com/HT207801Vendor Advisory
- https://support.apple.com/HT207804Vendor Advisory
- https://support.apple.com/HT207798Vendor Advisory
- https://support.apple.com/HT207801Vendor Advisory
- https://support.apple.com/HT207804Vendor Advisory
Timeline
- Published
- Last Modified
- Status
- Modified
Frequently Asked Questions
What is CVE-2017-2531?
An issue was discovered in certain Apple products. iOS before 10.3.2 is affected. Safari before 10.1.1 is affected. tvOS before 10.2.1 is affected. The issue involves the "WebKit" component. It allows remote attackers to execute arbitrary code or cause a denial of service (memory corruption and application crash) via a crafted web site.
How severe is CVE-2017-2531?
Severity scoring for CVE-2017-2531 is pending analysis. The EPSS model estimates a 6.57% probability of exploitation in the next 30 days.
How do I fix CVE-2017-2531?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.
Are you affected by CVE-2017-2531?
Run a free Strix scan to check your systems for this vulnerability.
Scan your code nowSource: NVD / NIST
