CVE-2017-3264

UnknownEPSS 0.98%

Last modified

CVE-2017-3264 is a vulnerability of currently unknown severity. Vulnerability in the Siebel UI Framework component of Oracle Siebel CRM (subcomponent: Open UI). The supported version that is affected is 16.1. EPSS estimates a 0.98% chance of exploitation in the next 30 days.

Description

Vulnerability in the Siebel UI Framework component of Oracle Siebel CRM (subcomponent: Open UI). The supported version that is affected is 16.1. Difficult to exploit vulnerability allows low privileged attacker with network access via HTTP to compromise Siebel UI Framework. Successful attacks of this vulnerability can result in unauthorized update, insert or delete access to some of Siebel UI Framework accessible data. CVSS v3.0 Base Score 3.1 (Integrity impacts).

Metrics

EPSS Probability
0.98%

57.5th percentile

Probability of exploitation in the next 30 days. Learn more

Affected Software

VendorProductVersions
OracleSiebel Ui Framework16.1

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2017-3264?
Vulnerability in the Siebel UI Framework component of Oracle Siebel CRM (subcomponent: Open UI). The supported version that is affected is 16.1. Difficult to exploit vulnerability allows low privileged attacker with network access via HTTP to compromise Siebel UI Framework. Successful attacks of this vulnerability can result in unauthorized update, insert or delete access to some of Siebel UI Framework accessible data. CVSS v3.0 Base Score 3.1 (Integrity impacts).
How severe is CVE-2017-3264?
Severity scoring for CVE-2017-3264 is pending analysis. The EPSS model estimates a 0.98% probability of exploitation in the next 30 days.
How do I fix CVE-2017-3264?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2017-3264?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST