CVE-2017-5624

UnknownEPSS 2.67%

Last modified

CVE-2017-5624 is a vulnerability of currently unknown severity. An issue was discovered in OxygenOS before 4.0.3 for OnePlus 3 and 3T. The attacker can persistently make the (locked) bootloader start the platform with dm-verity disabled, by issuing the 'fastboot oem disable_dm_verity' command. EPSS estimates a 2.67% chance of exploitation in the next 30 days.

Description

An issue was discovered in OxygenOS before 4.0.3 for OnePlus 3 and 3T. The attacker can persistently make the (locked) bootloader start the platform with dm-verity disabled, by issuing the 'fastboot oem disable_dm_verity' command. Having dm-verity disabled, the kernel will not verify the system partition (and any other dm-verity protected partition), which may allow for persistent code execution and privilege escalation.

Metrics

EPSS Probability
2.67%

83.8th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
OneplusOxygenos<= 4.0.2

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2017-5624?
An issue was discovered in OxygenOS before 4.0.3 for OnePlus 3 and 3T. The attacker can persistently make the (locked) bootloader start the platform with dm-verity disabled, by issuing the 'fastboot oem disable_dm_verity' command. Having dm-verity disabled, the kernel will not verify the system partition (and any other dm-verity protected partition), which may allow for persistent code execution and privilege escalation.
How severe is CVE-2017-5624?
Severity scoring for CVE-2017-5624 is pending analysis. The EPSS model estimates a 2.67% probability of exploitation in the next 30 days.
How do I fix CVE-2017-5624?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2017-5624?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST