CVE-2017-8169

UnknownEPSS 1.00%

Last modified

CVE-2017-8169 is a vulnerability of currently unknown severity. Huawei smart phones with software earlier than VIE-L09C40B360 versions have a buffer overflow vulnerability due to the lack of parameter validation. An attacker tricks a user into installing a malicious APP which has the root privilege; the APP can send a specific parameter to the smart phone, causing the smartphone restart or arbitrary code execution.. EPSS estimates a 1.00% chance of exploitation in the next 30 days.

Description

Huawei smart phones with software earlier than VIE-L09C40B360 versions have a buffer overflow vulnerability due to the lack of parameter validation. An attacker tricks a user into installing a malicious APP which has the root privilege; the APP can send a specific parameter to the smart phone, causing the smartphone restart or arbitrary code execution.

Metrics

EPSS Probability
1.00%

58.4th percentile

Probability of exploitation in the next 30 days. Learn more

Weakness Enumeration

Affected Software

VendorProductVersions
HuaweiVie-L09 Firmware< vie-l09c40b360

References

Timeline

Published
Last Modified
Status
Modified

Frequently Asked Questions

What is CVE-2017-8169?
Huawei smart phones with software earlier than VIE-L09C40B360 versions have a buffer overflow vulnerability due to the lack of parameter validation. An attacker tricks a user into installing a malicious APP which has the root privilege; the APP can send a specific parameter to the smart phone, causing the smartphone restart or arbitrary code execution.
How severe is CVE-2017-8169?
Severity scoring for CVE-2017-8169 is pending analysis. The EPSS model estimates a 1.00% probability of exploitation in the next 30 days.
How do I fix CVE-2017-8169?
Check the vendor references and advisories linked above for patched versions and mitigation guidance. You can also run a Strix scan to test if your systems are affected.

Are you affected by CVE-2017-8169?

Run a free Strix scan to check your systems for this vulnerability.

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Source: NVD / NIST